Publication | Closed Access
Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime
33
Citations
13
References
2005
Year
Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringPhysicsElectronic EngineeringBias Temperature InstabilityCondensed Matter PhysicsApplied PhysicsNbti Saturation EffectTime-dependent Dielectric BreakdownComputational ElectromagneticsElectric Field DependenceMicroelectronicsElectrical Insulation
| Year | Citations | |
|---|---|---|
1985 | 1.1K | |
1977 | 672 | |
2004 | 281 | |
2003 | 208 | |
2003 | 192 | |
2003 | 161 | |
1999 | 157 | |
2004 | 119 | |
2002 | 94 | |
2002 | 49 |
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