H. Karbasi

Dynamic recovery of negative bias temperature instability in <i>p</i>-type metal–oxide–semiconductor field-effect transistors

M. Ershov, Sharad Saxena, H. Karbasi et al. · Applied Physics Letters · 2003 · 161 citations

Semiconductors, Device Modeling, Electrical Engineering +12

Transient effects and characterization methodology of negative bias temperature instability in pMOS transistors

M. Ershov, R. Lindley, Sharad Saxena et al. · 2003 · 37 citations

Device Modeling, Pmos Transistors, Electrical Engineering +14

A novel integration of hyper-spectral imaging and neural networks to process waste electrical and electronic plastics

Alimohammad Tehrani, H. Karbasi · 2017 · 34 citations

Engineering, Machine Learning, Electronic Plastics +18

Characterization and modeling of MOSFET mismatch of a deep submicron technology

M. Quarantelli, Sharad Saxena, Nicola Dragone et al. · 2003 · 29 citations

Die Variation, Engineering, Vlsi Design +20

Uni-drive modular robots: theory, design, and experiments

H. Karbasi, Jan P. Huissoon, Amir Khajepour · Mechanism and Machine Theory · 2003 · 27 citations

Robot Kinematics, Engineering, Mechanical Engineering +7