Giuseppe La Rosa

The energy-driven paradigm of NMOSFET hot-carrier effects

Stewart E. Rauch, Giuseppe La Rosa · IEEE Transactions on Device and Materials Reliability · 2005 · 109 citations

Device Modeling, Electrical Engineering, Lucky Electron Model +12

NBTI-channel hot carrier effects in PMOSFETs in advanced CMOS technologies

Giuseppe La Rosa, F Guarin, Stewart E. Rauch et al. · 2002 · 94 citations

Device Modeling, Electrical Engineering, Semiconductor Device +13

Role of E-E scattering in the enhancement of channel hot carrier degradation of deep-submicron NMOSFETs at high V/sub GS/ conditions

Stewart E. Rauch, Giuseppe La Rosa, F Guarin · IEEE Transactions on Device and Materials Reliability · 2001 · 88 citations

Hc Lifetime, Electrical Engineering, Lucky Electron Model +12

Impact of NBTI Induced Statistical Variation to SRAM Cell Stability

Giuseppe La Rosa, Wee Loon Ng, Stewart E. Rauch et al. · 2006 · 55 citations

Non-volatile Memory, Electrical Engineering, Engineering +12

The energy driven paradigm of nMOSFET hot carrier effects

Stewart E. Rauch, Giuseppe La Rosa · 2005 · 34 citations

Device Modeling, Electrical Engineering, Engineering +11