S. Krishnan - Concepedia

Author

S. Krishnan

Texas Instruments (United States)

Also Known As

Krishnan S., Krishnan, S, Krishnan, Srikanth, S Krishnan, S. Chidambara Krishnan, S. Krishnan, Srikanth Krishnan

171

Publications

4.3K

Citations

H-Index

113

Concepts

All Affiliations

Texas Instruments (United States)Pennsylvania State University Purdue University West Lafayette University of California, Santa Barbara Arizona State University

About

S. Krishnan is an author at Texas Instruments (United States) specializing in engineering, microelectronics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	28	61	3.8K
2	Applied Physics	24	44	2.6K
3	Natural Sciences	3	3	124
4	Medicine	1	1	79
5	Chemistry	1	1	90

S. Krishnan

Publications

3.9K

Citations

H-Index

Page 1

	Year	Citations
Equation for the Stress-Strain Curve of Concrete Prakash Desayi, S. Krishnan ACI Journal Proceedings EngineeringCivil EngineeringConcrete TechnologyReinforced ConcreteStressstrain Analysis	1964	509
Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology Wenping Wang, V. Reddy, A.T. Krishnan, IEEE Transactions on Device and Materials Reliability Engineering65-Nm Cmos TechnologySemiconductor DeviceSemiconductorsHot Carrier	2007	357
A comprehensive framework for predictive modeling of negative bias temperature instability S. Chakravarthi, A.T. Krishnan, V. Reddy, EngineeringNbti StressDefect ToleranceMolecular HydrogenNumerical Simulation	2004	325
Impact of negative bias temperature instability on digital circuit reliability V. Reddy, A.T. Krishnan, Andrew Marshall, ReliabilityElectrical EngineeringReliability EngineeringEngineeringHardware Reliability	2003	229
NBTI impact on transistor and circuit: models, mechanisms and scaling effects [MOSFETs] A.T. Krishnan, V. Reddy, S. Chakravarthi, Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringVlsi Design	2004	198
Material dependence of hydrogen diffusion: implications for NBTI degradation A.T. Krishnan, C. Chancellor, S. Chakravarthi, Electrical EngineeringEngineeringDiffusion ResistancePhysicsFluorine Implantation	2006	180
Submicron scaling of HBTs M.J.W. Rodwell, Miguel Urteaga, T. Mathew, IEEE Transactions on Electron Devices Submicron ScalingWide-bandgap SemiconductorEngineeringSemiconductor DeviceRf Semiconductor	2001	176
Impact of negative bias temperature instability on digital circuit reliability Vijay Reddy, Anand Krishnan, Andrew Marshall, Microelectronics Reliability ReliabilityElectrical EngineeringReliability EngineeringEngineeringHardware Reliability	2004	119
Atomic-scale defects involved in the negative-bias temperature instability J. P. Campbell, Patrick M. Lenahan, Corey J. Cochrane, IEEE Transactions on Device and Materials Reliability EngineeringDefect ToleranceSemiconductor DeviceSemiconductorsQuantum Materials	2007	107
Negative bias temperature instability mechanism: The role of molecular hydrogen Anand Krishnan, S. Chakravarthi, Paul E. Nicollian, Applied Physics Letters Molecular KineticsEngineeringPhysicsHydrogen TransitionNatural Sciences	2006	90

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