S. Krishnan

Equation for the Stress-Strain Curve of Concrete

Prakash Desayi, S. Krishnan · ACI Journal Proceedings · 1964 · 509 citations

Engineering, Civil Engineering, Concrete Technology +6

Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology

Wenping Wang, V. Reddy, A.T. Krishnan et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 357 citations

Engineering, 65-Nm Cmos Technology, Semiconductor Device +23

A comprehensive framework for predictive modeling of negative bias temperature instability

S. Chakravarthi, A.T. Krishnan, V. Reddy et al. · 2004 · 325 citations

Engineering, Nbti Stress, Defect Tolerance +24

Impact of negative bias temperature instability on digital circuit reliability

V. Reddy, A.T. Krishnan, Andrew Marshall et al. · 2003 · 229 citations

Reliability, Electrical Engineering, Reliability Engineering +15

NBTI impact on transistor and circuit: models, mechanisms and scaling effects [MOSFETs]

A.T. Krishnan, V. Reddy, S. Chakravarthi et al. · 2004 · 198 citations

Device Modeling, Electrical Engineering, Semiconductor Device +11