S. Chakravarthi

A comprehensive framework for predictive modeling of negative bias temperature instability

S. Chakravarthi, A.T. Krishnan, V. Reddy et al. · 2004 · 325 citations

Engineering, Nbti Stress, Defect Tolerance +24

NBTI impact on transistor and circuit: models, mechanisms and scaling effects [MOSFETs]

A.T. Krishnan, V. Reddy, S. Chakravarthi et al. · 2004 · 198 citations

Device Modeling, Electrical Engineering, Semiconductor Device +11

Fundamentals of silicon material properties for successful exploitation of strain engineering in modern CMOS manufacturing

P.R. Chidambaram, C. Bowen, S. Chakravarthi et al. · IEEE Transactions on Electron Devices · 2006 · 191 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +24

Material dependence of hydrogen diffusion: implications for NBTI degradation

A.T. Krishnan, C. Chancellor, S. Chakravarthi et al. · 2006 · 180 citations

Electrical Engineering, Engineering, Diffusion Resistance +15

Negative bias temperature instability mechanism: The role of molecular hydrogen

Anand Krishnan, S. Chakravarthi, Paul E. Nicollian et al. · Applied Physics Letters · 2006 · 90 citations

Molecular Kinetics, Engineering, Physics +15