Paul E. Nicollian

Material dependence of hydrogen diffusion: implications for NBTI degradation

A.T. Krishnan, C. Chancellor, S. Chakravarthi et al. · 2006 · 180 citations

Electrical Engineering, Engineering, Diffusion Resistance +15

Experimental evidence for voltage driven breakdown models in ultrathin gate oxides

Paul E. Nicollian, W. R. Hunter, Jerry C. Hu · 2002 · 111 citations

Device Modeling, Breakdown Models, Electrical Engineering +14

Negative bias temperature instability mechanism: The role of molecular hydrogen

Anand Krishnan, S. Chakravarthi, Paul E. Nicollian et al. · Applied Physics Letters · 2006 · 90 citations

Molecular Kinetics, Engineering, Physics +15

Low voltage stress-induced-leakage-current in ultrathin gate oxides

Paul E. Nicollian, M. Rödder, D.T. Grider et al. · 2003 · 65 citations

Materials Engineering, Electrical Engineering, Engineering +12

Trends for deep submicron VLSI and their implications for reliability

P.K. Chatterjee, W. R. Hunter, A. Amerasekera et al. · 1995 · 49 citations

Failure Rate Requirements, Engineering, Vlsi Design +20