A.T. Krishnan - Concepedia

Author

A.T. Krishnan

Texas Instruments (United States)ORCID

Also Known As

A. KRISHNAN, A. Krishnan, A. T. Krishnan, A.T. Krishnan, Abhinand Krishnan, Krishnan, A

Publications

2.2K

Citations

H-Index

Concepts

All Affiliations

Texas Instruments (United States)Pennsylvania State University

About

A.T. Krishnan is an author at Texas Instruments (United States) specializing in electrical engineering, engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	19	28	2K
2	Applied Physics	16	21	1.6K
3	Computer Engineering	8	8	766
4	Natural Sciences	2	2	35
5	Chemical Engineering	1	1	24

A.T. Krishnan

Publications

Citations

H-Index

Page 1

	Year	Citations
Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology Wenping Wang, V. Reddy, A.T. Krishnan, IEEE Transactions on Device and Materials Reliability Engineering65-Nm Cmos TechnologySemiconductor DeviceSemiconductorsHot Carrier	2007	357
A comprehensive framework for predictive modeling of negative bias temperature instability S. Chakravarthi, A.T. Krishnan, V. Reddy, EngineeringNbti StressDefect ToleranceMolecular HydrogenNumerical Simulation	2004	325
Impact of negative bias temperature instability on digital circuit reliability V. Reddy, A.T. Krishnan, Andrew Marshall, ReliabilityElectrical EngineeringReliability EngineeringEngineeringHardware Reliability	2003	229
NBTI impact on transistor and circuit: models, mechanisms and scaling effects [MOSFETs] A.T. Krishnan, V. Reddy, S. Chakravarthi, Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringVlsi Design	2004	198
Material dependence of hydrogen diffusion: implications for NBTI degradation A.T. Krishnan, C. Chancellor, S. Chakravarthi, Electrical EngineeringEngineeringDiffusion ResistancePhysicsFluorine Implantation	2006	180
Observations of NBTI-Induced Atomic-Scale Defects J. P. Campbell, Patrick M. Lenahan, A.T. Krishnan, IEEE Transactions on Device and Materials Reliability SemiconductorsSpintronicsElectrical EngineeringBond CenterEngineering	2006	72
Impact of negative bias temperature instability on product parametric drift V. Reddy, John M. Carulli, A.T. Krishnan, Electrical EngineeringEngineeringParameter DriftPhysicsSystematic Test Methodology	2005	70
NBTI: An Atomic-Scale Defect Perspective J. P. Campbell, Patrick M. Lenahan, A.T. Krishnan, Atomic-scale Defect PerspectiveEngineeringMagnetic ResonanceDefect ToleranceSemiconductor Device	2006	55
Direct observation of the structure of defect centers involved in the negative bias temperature instability J. P. Campbell, Patrick M. Lenahan, A.T. Krishnan, Applied Physics Letters EngineeringModest Negative BiasMagnetic ResonanceDefect ToleranceSemiconductor Device	2005	53
Gate Leakage vs. NBTI in Plasma Nitrided Oxides: Characterization, Physical Principles, and Optimization Ahmad E. Islam, Gaurav Gupta, Souvik Mahapatra, Physical PrinciplesEngineeringVlsi DesignPlasma Nitrided OxidesSemiconductor Device	2006	51

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