A.T. Krishnan

Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology

Wenping Wang, V. Reddy, A.T. Krishnan et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 357 citations

Engineering, 65-Nm Cmos Technology, Semiconductor Device +23

A comprehensive framework for predictive modeling of negative bias temperature instability

S. Chakravarthi, A.T. Krishnan, V. Reddy et al. · 2004 · 325 citations

Engineering, Nbti Stress, Defect Tolerance +24

Impact of negative bias temperature instability on digital circuit reliability

V. Reddy, A.T. Krishnan, Andrew Marshall et al. · 2003 · 229 citations

Reliability, Electrical Engineering, Reliability Engineering +15

NBTI impact on transistor and circuit: models, mechanisms and scaling effects [MOSFETs]

A.T. Krishnan, V. Reddy, S. Chakravarthi et al. · 2004 · 198 citations

Device Modeling, Electrical Engineering, Semiconductor Device +11

Material dependence of hydrogen diffusion: implications for NBTI degradation

A.T. Krishnan, C. Chancellor, S. Chakravarthi et al. · 2006 · 180 citations

Electrical Engineering, Engineering, Diffusion Resistance +15