V. Reddy

Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology

Wenping Wang, V. Reddy, A.T. Krishnan et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 360 citations

Engineering, Computer Engineering, Electrical Engineering +17

A comprehensive framework for predictive modeling of negative bias temperature instability

S. Chakravarthi, A.T. Krishnan, V. Reddy et al. · 2004 · 328 citations

Engineering, Electrical Engineering, Materials Science +17

Impact of negative bias temperature instability on digital circuit reliability

V. Reddy, A.T. Krishnan, Andrew Marshall et al. · 2003 · 229 citations

Engineering, Computer Engineering, Electrical Engineering +14

NBTI impact on transistor and circuit: models, mechanisms and scaling effects [MOSFETs]

A.T. Krishnan, V. Reddy, S. Chakravarthi et al. · 2004 · 198 citations

Engineering, Electrical Engineering, Analog Electronics +16

Material dependence of hydrogen diffusion: implications for NBTI degradation

A.T. Krishnan, C. Chancellor, S. Chakravarthi et al. · 2006 · 180 citations

Engineering, Electrical Engineering, Materials Science +17