D.T. Grider

35% drive current improvement from recessed-SiGe drain extensions on 37 nm gate length PMOS

P.R. Chidambaram, B. Smith, Lindsey Hall et al. · 2004 · 89 citations

Device Modeling, Electrical Engineering, Nm Gate Length +12

Low voltage stress-induced-leakage-current in ultrathin gate oxides

Paul E. Nicollian, M. Rödder, D.T. Grider et al. · 2003 · 65 citations

Materials Engineering, Electrical Engineering, Engineering +12

Transistor design issues in integrating analog functions with high performance digital CMOS

Amitava Chatterjee, K. Vasanth, D.T. Grider et al. · 2003 · 55 citations

Electrical Engineering, Engineering, Transistor Design Issues +11

Ultrathin nitrogen-profile engineered gate dielectric films

S. V. Hattangady, R. Kraft, D.T. Grider et al. · 2002 · 35 citations

Materials Science, Gate Electrode/dielectric, Electrical Engineering +13

Extending the reliability scaling limit of SiO/sub 2/ through plasma nitridation

Paul E. Nicollian, Greg Baldwin, Kwame N. Eason et al. · 2002 · 20 citations

Gate Dielectrics, Electrical Engineering, Engineering +14