Lindsey Hall

Reliability Properties of Low-Voltage Ferroelectric Capacitors and Memory Arrays

J. Antonio Travieso-Rodríguez, K. Remack, K. Boku et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 107 citations

Reliability, Non-volatile Memory, Electrical Engineering +12

35% drive current improvement from recessed-SiGe drain extensions on 37 nm gate length PMOS

P.R. Chidambaram, B. Smith, Lindsey Hall et al. · 2004 · 89 citations

Device Modeling, Electrical Engineering, Nm Gate Length +12

Self-aligned metal capping layers for copper interconnects using electroless plating

Jeff Gambino, Jean Wynne, J. Gill et al. · Microelectronic Engineering · 2006 · 64 citations

Materials Science, Electrical Engineering, Self-aligned Metal +8

Cobalt bottom-up contact and via prefill enabling advanced logic and DRAM technologies

Marleen H. van der Veen, K. Vandersmissen, Dries Dictus et al. · 2015 · 52 citations

Engineering, Contact Fill, Emerging Memory Technology +21

Copper Deposition on HF Etched Silicon Surfaces: Morphological and Kinetic Studies

Oliver Chyan, Jin‐Jian Chen, Hsu Y. Chien et al. · Journal of The Electrochemical Society · 1996 · 51 citations

Engineering, Cu Deposition, Chemistry +20