P.R. Chidambaram

Fundamentals of silicon material properties for successful exploitation of strain engineering in modern CMOS manufacturing

P.R. Chidambaram, C. Bowen, S. Chakravarthi et al. · IEEE Transactions on Electron Devices · 2006 · 193 citations

Engineering, Electrical Engineering, Materials Engineering +17

35% drive current improvement from recessed-SiGe drain extensions on 37 nm gate length PMOS

P.R. Chidambaram, B. Smith, Lindsey Hall et al. · 2004 · 89 citations

Engineering, Electrical Engineering, Materials Science +15

A thermodynamic criterion to predict wettability at metal- alumina interfaces

P.R. Chidambaram, G.R. Edwards, D.L. Olson · Metallurgical Transactions B · 1992 · 81 citations

Natural Sciences, Materials Engineering, Materials Science +14

A comparison of the wettability of copper-copper oxide and silver-copper oxide on polycrystalline alumina

Alan Meier, P.R. Chidambaram, G.R. Edwards · Journal of Materials Science · 1995 · 55 citations

Natural Sciences, Materials Engineering, Materials Science +11

Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node

Pragya Kushwaha, Yen-Kai Lin, Avirup Dasgupta et al. · IEEE Electron Device Letters · 2019 · 44 citations

Engineering, Electrical Engineering, Electronic Materials +16