P.R. Chidambaram

Fundamentals of silicon material properties for successful exploitation of strain engineering in modern CMOS manufacturing

P.R. Chidambaram, C. Bowen, S. Chakravarthi et al. · IEEE Transactions on Electron Devices · 2006 · 191 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +24

35% drive current improvement from recessed-SiGe drain extensions on 37 nm gate length PMOS

P.R. Chidambaram, B. Smith, Lindsey Hall et al. · 2004 · 89 citations

Device Modeling, Electrical Engineering, Nm Gate Length +12

A thermodynamic criterion to predict wettability at metal- alumina interfaces

P.R. Chidambaram, G.R. Edwards, D.L. Olson · Metallurgical Transactions B · 1992 · 81 citations

Materials Science, Aluminium Nitride, Engineering +9

A comparison of the wettability of copper-copper oxide and silver-copper oxide on polycrystalline alumina

Alan Meier, P.R. Chidambaram, G.R. Edwards · Journal of Materials Science · 1995 · 55 citations

Materials Science, Materials Engineering, Chemical Engineering +11

Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node

Pragya Kushwaha, Harshit Agarwal, Yen-Kai Lin et al. · IEEE Electron Device Letters · 2019 · 43 citations

Device Modeling, Electrical Engineering, Engineering +15