Neal Mielke

Bit error rate in NAND Flash memories

Neal Mielke, Todd A. Marquart, Ning Wu et al. · 2008 · 355 citations

Hardware Security, Flash Memories, Memory Architecture +14

Universal recovery behavior of negative bias temperature instability [PMOSFETs]

S. Rangan, Neal Mielke, Everett C. C. Yeh · 2004 · 281 citations

Device Modeling, Degradation Independent Recovery, Electrical Engineering +9

Flash EEPROM Threshold Instabilities due to Charge Trapping During Program/Erase Cycling

Neal Mielke, Hanmant Belgal, I. Kalastirsky et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 167 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +11

Recovery Effects in the Distributed Cycling of Flash Memories

Neal Mielke, Hanmant Belgal, A. Fazio et al. · 2006 · 129 citations

Engineering, Recovery Effects, Computer Architecture +18

A new reliability model for post-cycling charge retention of flash memories

Hanmant Belgal, Nick Righos, I. Kalastirsky et al. · 2003 · 107 citations

Non-volatile Memory, Engineering, Post-cycling Charge Retention +18