S. Rangan

Universal recovery behavior of negative bias temperature instability [PMOSFETs]

S. Rangan, Neal Mielke, Everett C. C. Yeh · 2004 · 281 citations

Device Modeling, Degradation Independent Recovery, Electrical Engineering +9

Assessment of charge-induced damage to ultra-thin gate MOSFETs

S. Krishnan, S. Rangan, S. V. Hattangady et al. · 2002 · 42 citations

Engineering, Novel Antenna Structure, Metal Etch +16

Antenna device reliability for ULSI processing

S. Krishnan, A. Amerasekera, S. Rangan et al. · 2002 · 35 citations

Engineering, Antenna Device Reliability, Semiconductor Device +19

Inductively coupled plasma (ICP) metal etch damage to 35-60 A gate oxide

S. Krishnan, W.W. Dostalik, K. Brennan et al. · 2002 · 28 citations

Engineering, Icp Metal Etch, Semiconductor Device +17

Multi-layered nanocavities in silicon with sequential helium implantation/anneal

S. Rangan, S. Ashok, Gong Chen et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2003 · 14 citations

Nanoscale Science, Engineering, Physics +7