Fu-Chieh Hsu - Concepedia

Concepedia

Author

Fu-Chieh Hsu

University of California, Berkeley

Also Known As

FU-CHIEH HSU, Fu-Chieh Hsu

19

Publications

1.7K

Citations

6

H-Index

17

Concepts

All Affiliations

University of California, Berkeley Hewlett-Packard (United States)

FH

About

Fu-Chieh Hsu is an author at University of California, Berkeley specializing in electrical engineering, microelectronics, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	5	5	543
2	Electrical Engineering	5	5	543
3	Applied Physics	4	4	507
4	Computer Engineering	2	2	41
5	Physics	2	2	349

Fu-Chieh Hsu

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6

Publications

1.7K

Citations

6

H-Index

	Year	Citations
Hot-electron-induced MOSFET degradation&#8212;Model, monitor, and improvement Chenming Hu, Simon Tam, Fu-Chieh Hsu, IEEE Transactions on Electron Devices	1985	1.1K
Hot-Electron-Induced MOSFET Degradation - Model, Monitor, and Improvement Chenming Hu, Simon Tam, Fu-Chieh Hsu, IEEE Journal of Solid-State Circuits Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringPhysics	1985	335
An analytical breakdown model for short-channel MOSFET's Fu-Chieh Hsu, Ping-Keung Ko, Simon Tam, IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringAnalytical Breakdown ModelEngineeringSemiconductor Device	1982	131
A simplified model of short-channel MOSFET characteristics in the breakdown mode Fu-Chieh Hsu, R.S. Muller, Chenming Hu IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringSnapback Characteristic	1983	36
A simple punchthrough model for short-channel MOSFET's Fu-Chieh Hsu, R.S. Muller, Chenming Hu, IEEE Transactions on Electron Devices Device ModelingSevere LimitationsElectrical EngineeringSemiconductor TechnologyEngineering	1983	27
Hot-electron degradation in submicron VLSI Fu-Chieh Hsu, John Hui, K.Y. Chiu EngineeringVlsi DesignComputer ArchitecturePower ElectronicsSemiconductor Device	1985	14

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