H. Aono

Theory and Practice of On-the-fly and Ultra-fast V<inf>T</inf> Measurements for NBTI Degradation: Challenges and Opportunities

Ahmad E. Islam, E. N. Kumar, Hemjyoti Das et al. · 2007 · 40 citations

Engineering, Electrical Engineering, Physics +16

Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime

H. Aono, Eiichi Murakami, Kikuo Okuyama et al. · Microelectronics Reliability · 2005 · 33 citations

Engineering, Electrical Engineering, Microelectronics +13

Modeling of NBTI degradation and its impact on electric field dependence of the lifetime

H. Aono, Eiichi Murakami, Kikuo Okuyama et al. · 2004 · 24 citations

Engineering, Electrical Engineering, Microelectronics +16

A study of SRAM NBTI by OTF measurement

H. Aono, Eiichi Murakami, K. Shiga et al. · 2008 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +14

A new aspect of time-dependent clustering model for non-uniform dielectric TDDB

Tatsuo Shimizu, N. Suzumura, K. Ohgata et al. · 2016 · 11 citations

Natural Sciences, Electrical Engineering, Materials Science +17