Concepedia

N. Suzumura

NS

Statistics

Publications

8

Citations

227

H-Index

8

Active since

2006

Affiliations

Renesas Electronics (Japan)(Current)

Hitachi (Japan)

Renesas Electronics (United States)

N. Suzumura is an author at Renesas Electronics (Japan) specializing in materials science, electronic materials, and dielectrics.

Publications per year

2006–2016

8

Publications

8

A New TDDB Degradation Model Based on Cu Ion Drift in Cu Interconnect Dielectrics

N. Suzumura, S. Yamamoto, Daisuke Kodama et al. · 2006 · 107 citations

Engineering, Electrical Engineering, Materials Science +17

Impact of Al in Cu alloy interconnects on electro and stress migration reliabilities

Kazuyoshi Maekawa, Kenichi Mori, N. Suzumura et al. · Microelectronic Engineering · 2008 · 31 citations

Natural Sciences, Materials Engineering, Materials Science +14

Phenomenological classification of stress-induced leakage current and time-dependent dielectric breakdown mechanism

Hiroshi Miyazaki, Daisuke Kodama, N. Suzumura · Journal of Applied Physics · 2009 · 22 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Electric-field and temperature dependencies of TDDB degradation in Cu/Low-K damascene structures

N. Suzumura, S. Yamamoto, Daisuke Kodama et al. · 2008 · 19 citations

Engineering, Materials Engineering, Materials Science +17

The observation of stress-induced leakage current of damascene interconnects after bias temperature aging

Hiroshi Miyazaki, Daisuke Kodama, N. Suzumura · 2008 · 14 citations

Natural Sciences, Electrical Engineering, Materials Science +17

1–5 of 8