Microelectronics Reliability

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Microelectronics and reliability, Microelectronics reliability

30.9K

Publications

198.3K

Citations

888

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Microelectronics Reliability is a journal.

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#	Concept	H-Index	Publications	Citations
1	Engineering	124	4.4K	149.4K
2	Business	20	48	1.1K
3	Education	19	44	1.2K
4	Health Sciences	8	8	315
5	Language Studies	1	1	31

Microelectronics Reliability

30.9K

Publications

198.3K

Citations

Showing yearly statistics from 2000-2026.

Page 1

	Year	Citations
A survey of design methods for failure detection in dynamic systems Microelectronics Reliability Reliability EngineeringEngineeringFault ManagementVerificationComputer Engineering	1977	1.4K
Selected failure mechanisms of modern power modules Mauro Ciappa Microelectronics Reliability ReliabilityElectrical EngineeringReliability EngineeringEngineeringHardware Reliability	2002	955
Models for contacts to planar devices Microelectronics Reliability Geometric ModelingEngineeringDesignWearable TechnologyComputer Engineering	1972	818
Probabilistic reliability: An engineering approach Microelectronics Reliability ReliabilityReliability EngineeringEngineeringReliability ModellingUncertainty Quantification	1969	764
A comprehensive model of PMOS NBTI degradation Md Ashraful Alam, Souvik Mahapatra Microelectronics Reliability Device ModelingElectrical EngineeringEngineeringBias Temperature InstabilityPmos Nbti Degradation	2004	750
Light emitting diodes reliability review Moon‐Hwan Chang, Diganta Das, P. V. Varde, Microelectronics Reliability ReliabilityElectrical EngineeringReliability EngineeringEngineeringSolid-state Lighting	2011	746
An ensemble model for predicting the remaining useful performance of lithium-ion batteries Yinjiao Xing, Eden W.M., Kwok‐Leung Tsui, Microelectronics Reliability Electric BatteryEngineeringData ScienceEnergy ManagementPredictive Analytics	2013	625
Reliability challenges in 3D IC packaging technology K. N. Tu Microelectronics Reliability Reliability3D Ic ArchitectureChip-scale PackageEngineeringAdvanced Packaging (Semiconductors)	2010	622
Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities Tibor Grasser Microelectronics Reliability Electrical EngineeringEngineeringPhysicsRandom Telegraph NoiseOxide Electronics	2011	514
Solder joint fatigue models: review and applicability to chip scale packages W.W Lee, Luu Nguyen, Guna S Selvaduray Microelectronics Reliability Reliability EngineeringEngineeringChip-scale PackageHardware ReliabilityMechanical Engineering	2000	504

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