M.F. Li

Dynamic NBTI of PMOS transistors and its impact on device lifetime

G. Chen, K.Y. Chuah, M.F. Li et al. · 2003 · 192 citations

Pmos Transistors, Electrical Engineering, Cmos Inverter Circuit +12

Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling

G. Chen, M.F. Li, C. H. Ang et al. · IEEE Electron Device Letters · 2002 · 163 citations

Device Modeling, Electrical Engineering, Engineering +14

A TaN–<tex>$hbox HfO_2$</tex>–Ge pMOSFET With Novel<tex>$hbox SiH_4$</tex>Surface Passivation

Nan Wu, Q. Zhang, Chunxiang Zhu et al. · IEEE Electron Device Letters · 2004 · 111 citations

Electrical Engineering, Engineering, Hbox Sih_4 +12

Improvement of Voltage Linearity in High-<tex>$kappa$</tex>MIM Capacitors Using<tex>$hbox HfO_2hbox --hbox SiO_2$</tex>Stacked Dielectric

S.J. Kim, Byung Jin Cho, M.F. Li et al. · IEEE Electron Device Letters · 2004 · 93 citations

Materials Science, Electrical Engineering, Dielectrics +11

Evidence and Understanding of ALD<tex>$hbox HfO_2hbox --hbox Al_2hbox O_3$</tex>Laminate MIM Capacitors Outperforming Sandwich Counterparts

Shi‐Jin Ding, Hang Hu, Chunxiang Zhu et al. · IEEE Electron Device Letters · 2004 · 38 citations

Materials Science, Electrical Engineering, Dielectrics +10