S.J. Kim

Improvement of Voltage Linearity in High-<tex>$kappa$</tex>MIM Capacitors Using<tex>$hbox HfO_2hbox --hbox SiO_2$</tex>Stacked Dielectric

S.J. Kim, Byung Jin Cho, M.F. Li et al. · IEEE Electron Device Letters · 2004 · 93 citations

Materials Science, Electrical Engineering, Dielectrics +11

High-performance MIM capacitor using ALD high-k HfO₂-Al₂O₃ laminate dielectrics

Shi‐Jin Ding, Hang Hu, H.F. Lim et al. · IEEE Electron Device Letters · 2003 · 72 citations

Materials Engineering, Materials Science, Electrical Engineering +14

Evidence and Understanding of ALD<tex>$hbox HfO_2hbox --hbox Al_2hbox O_3$</tex>Laminate MIM Capacitors Outperforming Sandwich Counterparts

Shi‐Jin Ding, Hang Hu, Chunxiang Zhu et al. · IEEE Electron Device Letters · 2004 · 38 citations

Materials Science, Electrical Engineering, Dielectrics +10

Voltage and temperature dependence of capacitance of high-k HfO/sub 2/ MIM capacitors: a unified understanding and prediction

Chunxiang Zhu, Hang Hu, Xiongfei Yu et al. · 2004 · 25 citations

Engineering, Temperature Dependence, Silicon On Insulator +17

Bias and thermal annealings of radiation-induced leakage currents in thin-gate oxides

Chew-Hoe Ang, Chung-Ho Ling, Zhiyuan Cheng et al. · IEEE Transactions on Nuclear Science · 2000 · 12 citations

Bias Annealing, Electrical Engineering, Thin-gate Oxides +12