Xiongfei Yu - Concepedia

Author

Xiongfei Yu

National University of Singapore

Also Known As

X M Yu, X.M. Yu, Xiongfei Yu

Publications

506

Citations

H-Index

Concepts

All Affiliations

National University of Singapore Institute of Microelectronics The University of Texas at Austin National Yang Ming Chiao Tung University Institute of Materials Research and Engineering

About

Xiongfei Yu is an author at National University of Singapore specializing in electrical engineering, microelectronics, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	9	9	466
2	Electrical Engineering	9	9	466
3	Applied Physics	8	8	392
4	Materials Science	5	5	342
5	Materials Engineering	2	2	92

Xiongfei Yu

Publications

466

Citations

H-Index

Page 1

	Year	Citations
A high-density MIM capacitor (13 fF/μm/sup 2/) using ALD HfO<sub>2</sub> dielectrics Xiongfei Yu, Chunxiang Zhu, Hang Hu, IEEE Electron Device Letters Materials ScienceElectrical EngineeringMaterial AnalysisEngineeringHigh-density Mim Capacitor	2003	144
RF, DC, and reliability characteristics of ALD HfO/sub 2/-Al/sub 2/O/sub 3/ laminate MIM capacitors for Si RF IC applications Shi‐Jin Ding, Hang Hu, Chunxiang Zhu, IEEE Transactions on Electron Devices Electrical EngineeringHigh-performance Metal-insulator-metal CapacitorsEngineeringRf SemiconductorLaminate Capacitor	2004	74
MIM capacitors using atomic-layer-deposited high-/spl kappa/ (HfO/sub 2/)/sub 1-x/(Al/sub 2/O/sub 3/)/sub x/ dielectrics Hang Hu, Chunxiang Zhu, Xiongfei Yu, IEEE Electron Device Letters DielectricsEngineeringCapacitance DensityThin Film Process Technology/Sub X/ Dielectrics	2003	73
PVD HfO<sub>2</sub> for high-precision MIM capacitor applications Sun Jung Kim, Byung Jin Cho, Ming Fu Li, IEEE Electron Device Letters Low-power ElectronicsMaterials ScienceElectrical EngineeringEngineeringInsulator Thickness	2003	58
Electrical characteristics and suppressed boron penetration behavior of thermally stable HfTaO gate dielectrics with polycrystalline-silicon gate Xiongfei Yu, Chunxiang Zhu, M. F. Li, Applied Physics Letters EngineeringSilicon On InsulatorBoron Penetration BehaviorHftao FilmsSemiconductor Device	2004	48
Voltage and temperature dependence of capacitance of high-k HfO/sub 2/ MIM capacitors: a unified understanding and prediction Chunxiang Zhu, Hang Hu, Xiongfei Yu, EngineeringTemperature DependenceSilicon On InsulatorSemiconductor DeviceElectromagnetic Compatibility	2004	25
High mobility and excellent electrical stability of MOSFETs using a novel HfTaO gate dielectric Xiongfei Yu, Chunxiang Zhu, X.P. Wang, Materials ScienceMaterials EngineeringElectrical EngineeringExcellent Electrical StabilityEngineering	2004	19
Impact of nitrogen in HfON gate dielectric with metal gate on electrical characteristics, with particular attention to threshold voltage instability Xiongfei Yu, Chunxiang Zhu, Mingbin Yu Applied Physics Letters Induced Vth InstabilityElectrical EngineeringMetal GateVoltage InstabilityHfon Gate Dielectric	2007	13
Advanced HfTaON/SiO/sub 2/ gate stack with high mobility and low leakage current for low-standby-power application Xiongfei Yu, Mingbin Yu, Chunxiang Zhu IEEE Electron Device Letters Low-power ElectronicsNovel Hftaon/sio/sub 2/Electrical EngineeringEngineeringVlsi Design	2006	12

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