Ming Fu Li

Lattice strain analysis of transistor structures with silicon–germanium and silicon–carbon source∕drain stressors

Kah‐Wee Ang, King-Jien Chui, Vladimir Bliznetsov et al. · Applied Physics Letters · 2005 · 111 citations

Engineering, Mechanical Engineering, Silicon–carbon Source∕drain Stressors +18

Chloroplast Genomic Resource of Paris for Species Discrimination

Yun Song, Shaojun Wang, Ding Yuan-ming et al. · Scientific Reports · 2017 · 77 citations · Full text

Enhanced performance in 50 nm N-MOSFETs with silicon-carbon source/drain regions

Kah‐Wee Ang, King Jien Chui, V. Blimetsov et al. · 2005 · 72 citations

Semiconductor Technology, Electrical Engineering, Engineering +11

PVD HfO₂ for high-precision MIM capacitor applications

Sun Jung Kim, Byung Jin Cho, Ming Fu Li et al. · IEEE Electron Device Letters · 2003 · 58 citations

Low-power Electronics, Materials Science, Electrical Engineering +11

Dynamic Bias-Temperature Instability in Ultrathin SiO₂and HfO₂Metal-Oxide-Semiconductor Field Effect Transistors and Its Impact on Device Lifetime

Ming Fu Li, Gang Chen, Chen Shen et al. · Japanese Journal of Applied Physics · 2004 · 27 citations