Dynamic Bias-Temperature Instability in Ultrathin SiO<sub>2</sub>and HfO<sub>2</sub>Metal-Oxide-Semiconductor Field Effect Transistors and Its Impact on Device Lifetime - Concepedia

Concepedia

Publication | Closed Access

Dynamic Bias-Temperature Instability in Ultrathin SiO<sub>2</sub>and HfO<sub>2</sub>Metal-Oxide-Semiconductor Field Effect Transistors and Its Impact on Device Lifetime

27

Citations

1

References

2004

Year

Ming Fu Li, Gang Chen, Chen Shen, Xinpeng Wang, H.Y. Yu, Yee‐Chia Yeo, Dim Lee Kwong

Japanese Journal of Applied Physics

Abstract

10.1143/JJAP.43.7807

References

	Year	Citations

Page 1