N. Kimizuka

The impact of bias temperature instability for direct-tunneling ultra-thin gate oxide on MOSFET scaling

N. Kimizuka, T. Yamamoto, Tohru Mogami et al. · 2003 · 208 citations

Electrical Engineering, Engineering, Physics +12

NBTI enhancement by nitrogen incorporation into ultrathin gate oxide for 0.10-μm gate CMOS generation

N. Kimizuka, Keiko Yamaguchi, K. Imai et al. · 2002 · 139 citations

Engineering, Ultrathin Gate Oxide, Nitrogen Incorporation +16

A novel curved CMOS image sensor integrated with imaging system

K. Itonaga, Takehiro Arimura, Kazuya Matsumoto et al. · 2014 · 36 citations

Optical Design, Engineering, Optic Design +21

CMOS device optimization for system-on-a-chip applications

Kazuo Imai, Koji Yamaguchi, Tomoaki Kudo et al. · 2002 · 15 citations

Hardware Security, System On Chip, Low-power Electronics +13

System LSI multi-vth transistors design methodology for maximizing efficiency of body-biasing control to reduce vth variation and power consumption

Y. Yasuda, N. Kimizuka, Yutaka Akiyama et al. · 2006 · 14 citations

Low-power Electronics, Multi-vth Transistors, Electrical Engineering +13