N. Kimizuka

The impact of bias temperature instability for direct-tunneling ultra-thin gate oxide on MOSFET scaling

N. Kimizuka, T. Yamamoto, Tohru Mogami et al. · 1999 · 208 citations

Engineering, Electrical Engineering, Electronic Materials +16

NBTI enhancement by nitrogen incorporation into ultrathin gate oxide for 0.10-μm gate CMOS generation

N. Kimizuka, Keiko Yamaguchi, K. Imai et al. · 2002 · 139 citations

Engineering, Electrical Engineering, Materials Science +17

A novel curved CMOS image sensor integrated with imaging system

K. Itonaga, Takehiro Arimura, Kazuya Matsumoto et al. · 2014 · 37 citations

Natural Sciences, Biomedical Engineering, Digital Imaging +15

CMOS device optimization for system-on-a-chip applications

Kazuo Imai, Koji Yamaguchi, Tomoaki Kudo et al. · 2002 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +17

High-Density and Large-Scale MEA System Featuring 236,880 Electrodes at 11.72μm Pitch for Neuronal Network Analysis

Yuri Kato, Yoshihisa Matoba, Katsumi Honda et al. · 2020 · 15 citations

Engineering, Bioengineering, Neuroscience +17