Concepedia

Publication | Open Access

Exploration of gate trench module for vertical GaN devices

DOIFull Paper Access

12

Citations

29

References

2020

Year

Maria Ruzzarin, Karen Geens, Matteo Borga, H. Liang, Shuzhen You, Benoit Bakeroot, Stefaan Decoutere, Carlo De Santi, A. Neviani, Matteo Meneghini,
Microelectronics Reliability

References

YearCitations

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