Matteo Meneghini

The 2018 GaN power electronics roadmap

Hiroshi Amano, Yannick Baines, Edward Beam et al. · Journal of Physics D Applied Physics · 2018 · 1.3K citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives

Gaudenzio Meneghesso, G. Verzellesi, Francesca Danesin et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 642 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

GaN-based power devices: Physics, reliability, and perspectives

Matteo Meneghini, Carlo De Santi, Idriss Abid et al. · Journal of Applied Physics · 2021 · 628 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

The 2020 UV emitter roadmap

Hiroshi Amano, Ramón Collazo, Carlo De Santi et al. · Journal of Physics D Applied Physics · 2020 · 508 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Deep-Level Characterization in GaN HEMTs-Part I: Advantages and Limitations of Drain Current Transient Measurements

Davide Bisi, Matteo Meneghini, Carlo De Santi et al. · IEEE Transactions on Electron Devices · 2013 · 443 citations · Full text

Engineering, Electrical Engineering, Materials Science +17