Device Characterization

Device Characterization is the systematic experimental evaluation of the electrical, physical, and operational properties of semiconductor devices to determine their performance, reliability, and conformance to design specifications within the broader field of device analysis.

34K

Publications

1.3M

Citations

78.2K

Authors

5.8K

Institutions

Publications per year

2017–2026

5.8K

Parents

Semiconductor Devices

Children

Aging Degradation AnalysisBreakdown Voltage TestingCapacitance-voltage CharacterizationCarrier Mobility ExtractionCharge Trapping AnalysisContact Resistance MeasurementDielectric Constant MeasurementHysteresis CharacterizationInterface Trap Density MeasurementLeakage Current Analysis

Publications

34K

New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall Resistance

K. von Klitzing, G. Dorda, M. Pepper · Physical Review Letters · 1980 · 7K citations · Full text

Engineering, Electrical Engineering, Physics +17

Deep-level transient spectroscopy: A new method to characterize traps in semiconductors

D. V. Lang · Journal of Applied Physics · 1974 · 3.7K citations

Engineering, Electrical Engineering, Materials Science +16

Design of ion-implanted MOSFET's with very small physical dimensions

R.H. Dennard, F.H. Gaensslen, Hwa-Nien Yu et al. · IEEE Journal of Solid-State Circuits · 1974 · 3.5K citations

Engineering, Electrical Engineering, Microelectronics +16

Matching properties of MOS transistors

Marcel Pelgrom, Aad C.J. Duinmaijer, A.P.G. Welbers · IEEE Journal of Solid-State Circuits · 1989 · 3.3K citations

Engineering, Electrical Engineering, Materials Science +12

Extraction of Schottky diode parameters from forward current-voltage characteristics

S. K. Cheung, N.W. Cheung · Applied Physics Letters · 1986 · 2.7K citations

Engineering, Electrical Engineering, Materials Science +17

1–5 of 34K

Authors

78.2K

GG
G. Groeseneken
IMEC, Belgium
291 publications · 13.7K citations
57
h-index
CH
Chenming Hu
University of California, Berkeley, United States
167 publications · 10.1K citations
51
h-index
GM
Gaudenzio Meneghesso
University of Padua, Italy
140 publications · 7K citations
45
h-index
GG
G. Ghibaudo
Institut de Microélectronique, Electromagnétisme et Photonique, France
182 publications · 7.9K citations
44
h-index
EZ
Enrico Zanoni
University of Padua, Italy
145 publications · 6.9K citations
44
h-index

1–5 of 78.2K

Institutions

5.8K

1–8 of 5.8K

Venues

IEEE Transactions on Electron Devices
3.9K publications · 197.3K citations
164
h-index
IEEE Electron Device Letters
1.7K publications · 79.4K citations
116
h-index
Journal of Applied Physics
1.3K publications · 64.6K citations
108
h-index
Applied Physics Letters
1.3K publications · 58.4K citations
105
h-index
IEEE Transactions on Power Electronics
465 publications · 32.4K citations
96
h-index

1–5