Matteo Borga

The 2018 GaN power electronics roadmap

Hiroshi Amano, Yannick Baines, Edward Beam et al. · Journal of Physics D Applied Physics · 2018 · 1.3K citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Reliability and failure analysis in power GaN-HEMTs: An overview

Matteo Meneghini, Isabella Rossetto, Carlo De Santi et al. · 2017 · 110 citations

Engineering, Electrical Engineering, Materials Science +16

Evidence of Time-Dependent Vertical Breakdown in GaN-on-Si HEMTs

Matteo Borga, Matteo Meneghini, Isabella Rossetto et al. · IEEE Transactions on Electron Devices · 2017 · 54 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Impact of Substrate Resistivity on the Vertical Leakage, Breakdown, and Trapping in GaN-on-Si E-Mode HEMTs

Matteo Borga, Matteo Meneghini, Steve Stoffels et al. · IEEE Transactions on Electron Devices · 2018 · 49 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability

Steve Stoffels, Niels Posthuma, Stefaan Decoutere et al. · 2019 · 46 citations

Engineering, Electrical Engineering, Electronic Materials +16