Applied Physics Express · 2016 · 54 citations · 13 references
Gan Trench-gate MosfetsSemiconductor TechnologyElectrical EngineeringSidewall-mos-channel Plane OrientationEngineeringM-plane Sidewall ChannelsElectronic EngineeringTrench-gate MosfetApplied PhysicsTrench-gate Mosfet PerformancePower Semiconductor DeviceAluminum Gallium NitrideGan Power DeviceElectrical PerformanceMicroelectronicsSemiconductor Device
Abstract GaN trench-gate MOSFETs with m - and a -plane-oriented sidewall channels were fabricated and characterized. The trench-gate MOSFET performance depended strongly on the sidewall-MOS-channel plane orientation. The m -plane-oriented MOS channel devices demonstrated higher channel mobility, higher current density, lower sub-threshold slope, and lower hysteresis with similar threshold voltage and on–off ratio compared to a -plane MOS channel devices. These results indicate that orienting trench-gate MOSFET toward the m -plane would allow for better on-state characteristics while maintaining similar off-state characteristics.
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Tohru OKA, Tsutomu Ina, Yukihisa Ueno et al. · Applied Physics Express · 2015 · 339 citations
Wide-bandgap Semiconductor, Electrical Engineering, Engineering +9
Hui Nie, Quentin Diduck, Brian Alvarez et al. · IEEE Electron Device Letters · 2014 · 333 citations
Wide-bandgap Semiconductor, Electrical Engineering, Engineering +11