Comparing electrical performance of GaN trench-gate MOSFETs with a-plane and m-plane sidewall channels

Chirag Gupta, Silvia H. Chan, Cory Lund, Anchal Agarwal, Onur S. Koksaldi, Junqian Liu, Yuuki Enatsu, S. Keller, Umesh K. Mishra

Applied Physics Express · 2016 · 54 citations · 13 references

Concepts

Abstract

Abstract GaN trench-gate MOSFETs with m - and a -plane-oriented sidewall channels were fabricated and characterized. The trench-gate MOSFET performance depended strongly on the sidewall-MOS-channel plane orientation. The m -plane-oriented MOS channel devices demonstrated higher channel mobility, higher current density, lower sub-threshold slope, and lower hysteresis with similar threshold voltage and on–off ratio compared to a -plane MOS channel devices. These results indicate that orienting trench-gate MOSFET toward the m -plane would allow for better on-state characteristics while maintaining similar off-state characteristics.

References

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