Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations

Mustapha Faqir, Mohsine Bouya, Nathalie Malbert, Nathalie Labat, Dominique Carisetti, Benoît Lambert, G. Verzellesi, F. Fantini

Microelectronics Reliability · 2010 · 29 citations · 14 references

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