Concepedia

Publication | Open Access

Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations

DOIFull Paper Access

28

Citations

14

References

2010

Year

Mustapha Faqir, Mohsine Bouya, Nathalie Malbert, Nathalie Labat, Dominique Carisetti, Benoît Lambert, G. Verzellesi, F. Fantini
Microelectronics Reliability

References

YearCitations

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