Microelectronics Reliability · 2010 · 29 citations · 14 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice SimulationSemiconductor ReliabilityWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesAvalanche BreakdownAvalanche Breakdown In Wide-bandgap DevicesBreakdown SimulationCollapse-generated CurrentsCurrent CollapseGallium Nitride (Gan) MaterialsSaturation Current
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Trapping effects in GaN and SiC microwave FETs
S.C. Binari, P. B. Klein, T.E. Kazior · Proceedings of the IEEE · 2002 · 454 citations