Benoît Lambert

Statistics

Publications

Citations

426

H-Index

Active since

2008

Affiliations

United Monolithic Semiconductor (France)(Current)

United Monolithic Semiconductors (Germany)

Centre National de la Recherche Scientifique

Institut Polytechnique de Bordeaux

Laboratoire d'Analyse et d'Architecture des Systèmes

Benoît Lambert is an author at United Monolithic Semiconductor (France) specializing in electrical engineering, semiconductor devices, and engineering.

Publications per year

2008–2020

Publications

Operating channel temperature in GaN HEMTs: DC versus RF accelerated life testing

James W. Pomeroy, Michael J. Uren, Benoît Lambert et al. · Microelectronics Reliability · 2015 · 67 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

Transient Thermoreflectance for Gate Temperature Assessment in Pulse Operated GaN-Based HEMTs

Sara Martin-Horcajo, James W. Pomeroy, Benoît Lambert et al. · IEEE Electron Device Letters · 2016 · 39 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques

Mohsine Bouya, N. Malbert, Nathalie Labat et al. · Microelectronics Reliability · 2008 · 33 citations

Engineering, Electrical Engineering, Materials Science +15

GH25-10: New qualified power GaN HEMT process from technology to product overview

D. Floriot, V. Brunel, M. Camiade et al. · 2014 · 32 citations

Engineering, Electrical Engineering, Microelectronics +16

Dynamic Performance and Characterization of Traps Using Different Measurements Techniques for the New AlGaN/GaN HEMT of 0.15-$\mu$ m Ultrashort Gate Length

Mohamed Bouslama, V. Gillet, Christophe Chang et al. · IEEE Transactions on Microwave Theory and Techniques · 2019 · 31 citations

Engineering, Electrical Engineering, Instrumentation +16

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