P. B. Klein

Trapping effects in GaN and SiC microwave FETs

S.C. Binari, P. B. Klein, T.E. Kazior · Proceedings of the IEEE · 2002 · 454 citations

Engineering, Electrical Engineering, Materials Science +17

Current collapse and the role of carbon in AlGaN/GaN high electron mobility transistors grown by metalorganic vapor-phase epitaxy

P. B. Klein, S.C. Binari, K. Ikossi et al. · Applied Physics Letters · 2001 · 279 citations

Engineering, Materials Engineering, Materials Science +17

Lifetime-limiting defects in n− 4H-SiC epilayers

P. B. Klein, B. V. Shanabrook, S. Huh et al. · Applied Physics Letters · 2006 · 218 citations

Engineering, Electrical Engineering, Materials Science +17

Observation of deep traps responsible for current collapse in GaN metal–semiconductor field-effect transistors

P. B. Klein, Jaime A. Freitas, S.C. Binari et al. · Applied Physics Letters · 1999 · 189 citations

Engineering, Electrical Engineering, Materials Science +17

Symmetry and electronic structure of the Mn impurity in ZnS nanocrystals

T. A. Kennedy, E. R. Glaser, P. B. Klein et al. · Physical review. B, Condensed matter · 1995 · 179 citations

Natural Sciences, Materials Science, Physics +16