F. Fantini

Electromigration in thin-film interconnection lines: models, methods and results

A. Scorzoni, Bruno Neri, C. Caprile et al. · Materials Science Reports · 1991 · 145 citations

Electrical Engineering, Electromigration Technique, Engineering +6

Investigation of High-Electric-Field Degradation Effects in AlGaN/GaN HEMTs

Mustapha Faqir, G. Verzellesi, Gaudenzio Meneghesso et al. · IEEE Transactions on Electron Devices · 2008 · 137 citations · Full text

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +12

Activation energy in the early stage of electromigration in Al-1% Si/TiN/Ti bamboo lines

Ilaria De Munari, A. Scorzoni, Fabrizio Tamarri et al. · Semiconductor Science and Technology · 1995 · 123 citations

Aluminium Nitride, Engineering, Resistance Change +17

Mechanisms of RF Current Collapse in AlGaN–GaN High Electron Mobility Transistors

Mustapha Faqir, G. Verzellesi, Alessandro Chini et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 100 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +10

Experimental and Numerical Analysis of Hole Emission Process From Carbon-Related Traps in GaN Buffer Layers

Alessandro Chini, Gaudenzio Meneghesso, Matteo Meneghini et al. · IEEE Transactions on Electron Devices · 2016 · 100 citations · Full text

Numerical Analysis, Semiconductors, Electrical Engineering +14