Avalanche Breakdown

Avalanche Breakdown is a semiconductor physics phenomenon in which a rapid multiplication of charge carriers occurs due to impact ionization under high reverse-bias electric fields across a p-n junction, leading to a sudden increase in current conduction.

2K

Publications

83.5K

Citations

5.8K

Authors

1.2K

Institutions

Publications per year

2017–2026

288

Authors

5.8K

  1. CH
    Chee Hing Tan

    University of Sheffield, United Kingdom

    23 publications · 625 citations

    17

    h-index

  2. JC
    Joe C. Campbell

    The University of Texas at Austin, United States

    20 publications · 633 citations

    17

    h-index

  3. JD
    J.P.R. David

    University of Sheffield, United Kingdom

    24 publications · 715 citations

    16

    h-index

  4. JL
    Josef Lutz

    Chemnitz University of Technology, Germany

    18 publications · 579 citations

    15

    h-index

  5. YZ
    Yuhao Zhang

    Virginia Tech, United States

    15 publications · 726 citations

    14

    h-index

1–5 of 5.8K

Venues

  1. IEEE Transactions on Electron Devices

    257 publications · 12.2K citations

    59

    h-index

  2. Applied Physics Letters

    131 publications · 6.6K citations

    44

    h-index

  3. Journal of Applied Physics

    136 publications · 6.9K citations

    42

    h-index

  4. IEEE Electron Device Letters

    91 publications · 5.4K citations

    37

    h-index

  5. Solid-State Electronics

    69 publications · 2.9K citations

    27

    h-index

1–5