The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits

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Marcel Pelgrom, Aad C.J. Duinmaijer, A.P.G. Welbers · IEEE Journal of Solid-State Circuits · 1989 · 3.3K citations

Engineering, Electrical Engineering, Materials Science +12

Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/<i>ƒ</i>) noise

M. J. Kirton, Michael J. Uren · Advances In Physics · 1989 · 1.3K citations

Natural Sciences, Materials Science, Physics +17

The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps

Tibor Grasser, Ben Kaczer, Wolfgang Goes et al. · IEEE Transactions on Electron Devices · 2011 · 476 citations

Engineering, Electrical Engineering, Physics +15

Process Technology Variation

Kelin J. Kuhn, M.D. Giles, D. Becher et al. · IEEE Transactions on Electron Devices · 2011 · 365 citations

Engineering, Computer Engineering, Electrical Engineering +17

A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxides

R. Degraeve, G. Groeseneken, R. Bellens et al. · 2002 · 336 citations

Engineering, Electrical Engineering, Materials Science +17