Device Reliability is a subfield of microelectronics that characterizes the ability of semiconductor devices to perform their intended electrical functions without degradation or failure under specified operating conditions over a defined period of time.
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789.1K
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48.1K
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2017–2026
3.9K
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19.3K
An ultra-lightweight design for imperceptible plastic electronics
Martin Kaltenbrunner, Tsuyoshi Sekitani, Jonathan T. Reeder et al. · Nature · 2013 · 2.5K citations
Natural Sciences, Materials Engineering, Materials Science +12
The chips are down for Moore’s law
M. Mitchell Waldrop · Nature · 2016 · 2.3K citations · Full text
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48.1K
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4.3K
IBM (United States)
Armonk, United States
85 h-index
1.9K publications
116.3K citations
Intel (United States)
Santa Clara, United States
79 h-index
1.3K publications
84.6K citations
IMEC
Leuven, Belgium
72 h-index
3.8K publications
142.9K citations
Texas Instruments (United States)
Dallas, United States
70 h-index
1.3K publications
56.4K citations
IBM Research - Thomas J. Watson Research Center
Yorktown Heights, United States
68 h-index
705 publications
52.7K citations
Sandia National Laboratories
Albuquerque, United States
64 h-index
707 publications
40.5K citations
University of California, Berkeley
Berkeley, United States
61 h-index
670 publications
42K citations
Centre National de la Recherche Scientifique
Paris, France
58 h-index
1.4K publications
46.7K citations
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Venues
- IEEE Transactions on Electron Devices
1.3K publications · 67.9K citations
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- IEEE Transactions on Nuclear Science
803 publications · 38.8K citations
92
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- IEEE Electron Device Letters
777 publications · 31.3K citations
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- Microelectronics Reliability
1K publications · 36K citations
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- Applied Physics Letters
463 publications · 23.5K citations
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