Concepedia

Device Burn-in

Device Burn-In is a reliability assessment procedure in which electronic devices are operated under accelerated stress conditions for a predetermined period to identify and eliminate early-life failures before deployment.

144

Publications

4.5K

Citations

471

Authors

160

Institutions

Publications per year

2017–2026

18

Variants

Burn-in

Parents

Publications

144

A Nonlinear Random-Coefficients Model for Degradation Testing

Suk Joo Bae, Paul H. Kvam · Technometrics · 2004 · 171 citations

, , +13

Long-term stable polymer solar cells with significantly reduced burn-in loss

Jaemin Kong, Suhee Song, Minji Yoo et al. · Nature Communications · 2014 · 142 citations · Full text

, , +14

Burn-In

Henry W. Block, Thomas H. Savits · Statistical Science · 1997 · 130 citations · Full text

, , +16

Reliability of various size oxide aperture VCSELs

Bobby Hawkins, Robert A. Hawthorne, James K. Guenter et al. · 2003 · 121 citations

, , +17

Burn-In: an Engineering Approach to the Design and Analysis of Burn-In Procedures

P. D. T. O’Connor · Electronics and Power · 1983 · 109 citations

, , +3

1–5 of 144

Authors

471

  1. WK
    Way Kuo

    University of Tennessee at Knoxville, United States

    6 publications · 165 citations

    6

    h-index

  2. MS
    Manoj Sachdev

    University of Waterloo, Canada

    5 publications · 181 citations

    5

    h-index

  3. TB
    T.S. Barnett

    Auburn University, United States

    5 publications · 105 citations

    5

    h-index

  4. AV
    A. Vassighi

    University of Waterloo, Canada

    5 publications · 181 citations

    5

    h-index

  5. AS
    A.D. Singh

    Auburn University, United States

    5 publications · 105 citations

    5

    h-index

1–5 of 471

Institutions

160

  1. Intel (United States)

    Santa Clara, United States

    10 h-index

    22 publications

    761 citations

  2. Auburn University

    Auburn, United States

    5 h-index

    11 publications

    220 citations

  3. University of Waterloo

    Waterloo, Canada

    5 h-index

    13 publications

    377 citations

  4. Politecnico di Torino

    Turin, Italy

    5 h-index

    24 publications

    410 citations

  5. Texas Instruments (United States)

    Dallas, United States

    5 h-index

    17 publications

    434 citations

  6. University of California, Santa Barbara

    Santa Barbara, United States

    4 h-index

    9 publications

    378 citations

  7. Portland State University

    Portland, United States

    4 h-index

    5 publications

    195 citations

  8. Sandia National Laboratories

    Albuquerque, United States

    4 h-index

    15 publications

    432 citations

1–8 of 160

Venues

  1. IEEE Transactions on Reliability

    9 publications · 275 citations

    9

    h-index

  2. Reliability Engineering & System Safety

    4 publications · 112 citations

    4

    h-index

  3. IEEE Design & Test of Computers

    3 publications · 103 citations

    3

    h-index

  4. IIE Transactions

    3 publications · 130 citations

    3

    h-index

  5. IEEE Transactions on Nuclear Science

    3 publications · 127 citations

    3

    h-index

1–5