Statistical Science · 1997 · 130 citations · 22 references
EngineeringElectrical EngineeringComputer-integrated ManufacturingMicroelectronicsSemiconductor DevicesDevice ReliabilityIntegrated Circuit DesignIntegrated Circuit DevicesReliability ModelingReliability-based DesignSemiconductor ReliabilityBurn-in TestingCmos ReliabilityDevice Burn-inFailure MechanismsGate Oxide DegradationGate Oxide ReliabilityReliability Degradation MechanismsTechnology Reliability
A survey of recent research in burn-in is undertaken. The emphasis is on mixture models, criteria for optimal burn-in and burn-in at the component or system level.
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Bayesian Computation and Stochastic Systems
Julian Besag, Peter Green, David Higdon et al. · Statistical Science · 1995 · 958 citations · Full text