Burn-In Testing is a reliability validation method that distinguishes itself by subjecting components to elevated stress conditions for a predetermined period to identify and eliminate early-life failures before field deployment.
131
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4K
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399
Authors
146
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Publications per year
2017–2026
16
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Publications
131
A sub-130-nm conditional keeper technique
Atila Alvandpour, Ram Krishnamurthy, K. Soumyanath et al. · IEEE Journal of Solid-State Circuits · 2002 · 199 citations
Engineering, Computer Engineering, Electrical Engineering +17
Henry W. Block, Thomas H. Savits · Statistical Science · 1997 · 130 citations · Full text
Engineering, Electrical Engineering, Computer-integrated Manufacturing +16
1–5 of 131
Authors
399
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1–5 of 399
Institutions
146
Intel (United States)
Santa Clara, United States
9 h-index
17 publications
1.3K citations
Auburn University
Auburn, United States
6 h-index
11 publications
287 citations
Politecnico di Torino
Turin, Italy
5 h-index
24 publications
410 citations
Portland State University
Portland, United States
5 h-index
6 publications
211 citations
National Cheng Kung University
Tainan City, Taiwan
4 h-index
10 publications
192 citations
IBM (United States)
Armonk, United States
4 h-index
9 publications
190 citations
Texas Instruments (United States)
Dallas, United States
4 h-index
11 publications
353 citations
University of California, Santa Barbara
Santa Barbara, United States
4 h-index
13 publications
329 citations
1–8 of 146
Venues
- IEEE Transactions on Reliability
4 publications · 172 citations
4
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- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2 publications · 43 citations
2
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- International Journal of Production Research
2 publications · 46 citations
2
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- IEEE Transactions on Industrial Electronics
2 publications · 49 citations
2
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- Reliability Engineering & System Safety
2 publications · 81 citations
2
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