Ronald D. Schrimpf

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 398 citations

Engineering, Computer Engineering, Electrical Engineering +11

Response of advanced bipolar processes to ionizing radiation

E.W. Enlow, R.L. Pease, W.E. Combs et al. · IEEE Transactions on Nuclear Science · 1991 · 322 citations

Engineering, Electrical Engineering, Microelectronics +16

Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates

Daniel M. Fleetwood, S.L. Kosier, R.N. Nowlin et al. · IEEE Transactions on Nuclear Science · 1994 · 283 citations

Engineering, Diagnostic Sciences, Radiation Measurement +15

Monte Carlo Simulation of Single Event Effects

Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2010 · 221 citations

Engineering, Electrical Engineering, Physics +16

Charge separation for bipolar transistors

S.L. Kosier, Ronald D. Schrimpf, R.N. Nowlin et al. · IEEE Transactions on Nuclear Science · 1993 · 200 citations

Engineering, Electrical Engineering, Microelectronics +16