R.L. Pease

Response of advanced bipolar processes to ionizing radiation

E.W. Enlow, R.L. Pease, W.E. Combs et al. · IEEE Transactions on Nuclear Science · 1991 · 322 citations

Engineering, Electrical Engineering, Microelectronics +16

Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates

Daniel M. Fleetwood, S.L. Kosier, R.N. Nowlin et al. · IEEE Transactions on Nuclear Science · 1994 · 283 citations

Engineering, Diagnostic Sciences, Radiation Measurement +15

Charge separation for bipolar transistors

S.L. Kosier, Ronald D. Schrimpf, R.N. Nowlin et al. · IEEE Transactions on Nuclear Science · 1993 · 200 citations

Engineering, Electrical Engineering, Microelectronics +16

Hardness assurance testing of bipolar junction transistors at elevated irradiation temperatures

S.C. Witczak, Ronald D. Schrimpf, Daniel M. Fleetwood et al. · IEEE Transactions on Nuclear Science · 1997 · 134 citations

Engineering, Electrical Engineering, Materials Engineering +17

Dependence of total dose response of bipolar linear microcircuits on applied dose rate

S. McClure, R.L. Pease, W. Will et al. · IEEE Transactions on Nuclear Science · 1994 · 131 citations

Medicine, Radiation Oncology, Dose-response Modeling +13