Dependence of total dose response of bipolar linear microcircuits on applied dose rate

S. McClure, R.L. Pease, W. Will, +1

IEEE Transactions on Nuclear Science

Radiation PhysicsRadiation EffectRadiation ExposureDose RateLow Dose Rate +19

Mechanisms of Enhanced Radiation-Induced Degradation Due to Excess Molecular Hydrogen in Bipolar Oxides

X. J. Chen, Hugh Barnaby, Bert Vermeire, +8

IEEE Transactions on Nuclear Science

EngineeringRadiation Materials ScienceRadiation PhysicsRadiation EffectRadiation Exposure +16

Radiation effects in micro-electromechanical systems (MEMS): RF relays

S. McClure, Larry D. Edmonds, R.E. Mihailovich, +5

IEEE Transactions on Nuclear Science

Electrical EngineeringDielectric Charge TrappingEngineeringSwitch Actuation VoltageMicrofabrication +8

Enhanced low-dose-rate sensitivity of a low-dropout voltage regulator

R.L. Pease, S. McClure, J.L. Gorelick, +1

IEEE Transactions on Nuclear Science

Low-power ElectronicsElectrical EngineeringIonization-induced DegradationEngineeringHealth Sciences +11

Multi-Institutional Comparison of Whole Slide Digital Imaging and Optical Microscopy for Interpretation of Hematoxylin-Eosin–Stained Breast Tissue Sections

Savitri Krishnamurthy, Kurt Mathews, S. McClure, +11

Archives of Pathology & Laboratory Medicine

A compendium of recent total dose data on bipolar linear microcircuits

R.L. Pease, W.E. Combs, A.H. Johnston, +4

Space EnvironmentTotal Dose DegradationRadiation ExposureDose Rate DataRadiation Protection +17

An updated data compendium of enhanced low dose rate sensitive (ELDRS) bipolar linear circuits

R.L. Pease, S. McClure, A.H. Johnston, +6

Electrical EngineeringEngineeringCircuit SystemComputer EngineeringElevated Temperature Irradiation +8

Total Dose and Dose Rate Response of an AD590 Temperature Transducer

R.L. Pease, G.W. Dunham, J.E. Seiler, +2

IEEE Transactions on Nuclear Science

Total DoseRadiation EffectRadiation ExposureLow Dose RateRadiation Protection +15

Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode

Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, +6

IEEE Transactions on Nuclear Science

Commercial MramNon-volatile MemoryDynamic ModeEngineeringNuclear Physics +20

Total dose degradation of MEMS optical mirrors

T. F. Miyahira, Heidi N. Becker, S. McClure, +3

IEEE Transactions on Nuclear Science

EngineeringTotal Dose DegradationOptical GlassMechanical EngineeringOptical Testing +17