X. J. Chen

Mechanisms of Enhanced Radiation-Induced Degradation Due to Excess Molecular Hydrogen in Bipolar Oxides

X. J. Chen, Hugh Barnaby, Bert Vermeire et al. · IEEE Transactions on Nuclear Science · 2007 · 88 citations

Natural Sciences, Chemistry, Materials Science +16

Nature of Interface Defect Buildup in Gated Bipolar Devices Under Low Dose Rate Irradiation

X. J. Chen, Hugh Barnaby, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2006 · 34 citations

Engineering, Electrical Engineering, Materials Science +17

Estimation and verification of radiation induced N/sub ot/ and N/sub it/ energy distribution using combined bipolar and MOS characterization methods in gated bipolar devices

X. J. Chen, Hugh Barnaby, R.L. Pease et al. · IEEE Transactions on Nuclear Science · 2005 · 31 citations

Engineering, Electrical Engineering, Radiation Measurement +12

Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits

Philippe C. Adell, S. McClure, R.L. Pease et al. · 2007 · 14 citations

Engineering, Electrical Engineering, Materials Engineering +15