Hugh Barnaby

Total-Ionizing-Dose Effects in Modern CMOS Technologies

Hugh Barnaby · IEEE Transactions on Nuclear Science · 2006 · 689 citations

Engineering, Electrical Engineering, Materials Science +17

Analysis of single-event transients in analog circuits

Philippe C. Adell, Ronald D. Schrimpf, Hugh Barnaby et al. · IEEE Transactions on Nuclear Science · 2000 · 150 citations

Engineering, Electrical Engineering, Nuclear Engineering +16

The Energy Dependence of Proton-Induced Degradation in AlGaN/GaN High Electron Mobility Transistors

B.K. Choï, Hugh Barnaby, Daniel M. Fleetwood et al. · IEEE Transactions on Nuclear Science · 2004 · 140 citations

Engineering, Electrical Engineering, Materials Science +17

Compact Modeling of Total Ionizing Dose and Aging Effects in MOS Technologies

Ivan Sanchez Esqueda, Hugh Barnaby, M. King · IEEE Transactions on Nuclear Science · 2015 · 132 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Total ionizing dose effects in shallow trench isolation oxides

F. Faccio, Hugh Barnaby, Xiao J. Chen et al. · Microelectronics Reliability · 2008 · 122 citations

Medicine, Nuclear Engineering, Radiation Dosimetry +11