Analysis of single-event transients in analog circuits

Abstract

A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.