C. Barillot

Analysis of single-event transients in analog circuits

Philippe C. Adell, Ronald D. Schrimpf, Hugh Barnaby et al. · IEEE Transactions on Nuclear Science · 2000 · 150 citations

Engineering, Electrical Engineering, Nuclear Engineering +16

An empirical model for predicting proton induced upset

P. Calvel, C. Barillot, P. Lamothe et al. · IEEE Transactions on Nuclear Science · 1996 · 113 citations

Natural Sciences, Nuclear Engineering, Physics +8

Space radiation evaluation of 16 Mbit DRAMs for mass memory applications

P. Calvel, P. Lamothe, C. Barillot et al. · IEEE Transactions on Nuclear Science · 1994 · 39 citations

Engineering, Computer Engineering, Electrical Engineering +17

Evaluation and prediction of the degradation of a COTS CCD induced by displacement damage

Rosine Coq Germanicus, S. Barde, L. Dusseau et al. · IEEE Transactions on Nuclear Science · 2002 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +15

Review of commercial spacecraft anomalies and single-event-effect occurrences

C. Barillot, P. Calvel · IEEE Transactions on Nuclear Science · 1996 · 16 citations

Engineering, Aerospace Engineering, Astrodynamics +5