Concepedia

An empirical model for predicting proton induced upset

P. Calvel, C. Barillot, P. Lamothe, R. Ecoffet, S. Duzellier, D. Falguère

IEEE Transactions on Nuclear Science · 1996 · 113 citations · 16 references

Concepts

Natural SciencesNuclear EngineeringPhysicsNuclear PhysicsNuclear Safety AnalysisRadiation PhysicsHeavy-ion PhysicsHeavy Ion RadiationHeavy-ion Induced ReactionsSingle Event EffectsSingle Event Upset Modeling

Abstract

This paper presents an empirical model for proton induced Single Event Upset (SEU). This model is based on heavy ion data, and will improve the previous 'two parameters' Bendel model. Application to various parts is presented.

References

16

Rate prediction for single event effects-a critique

E.L. Petersen, J.C. Pickel, James H. Adams et al. · IEEE Transactions on Nuclear Science · 1992 · 279 citations

Engineering, Electrical Engineering, Circuit Theory +12

Two parameter Bendel model calculations for predicting proton induced upset (ICs)

W.J. Stapor, J.P. Meyers, J.B. Langworthy et al. · IEEE Transactions on Nuclear Science · 1990 · 77 citations

Engineering, Nuclear Engineering, Physics +7

Approaches to proton single-event rate calculations

E.L. Petersen · IEEE Transactions on Nuclear Science · 1996 · 65 citations

Natural Sciences, Nuclear Engineering, Physics +15

SEU test techniques for 256 K static RAMs and comparisons of upsets by heavy ions and protons

R. Koga, W. A. Kolasinski, J.V. Osborn et al. · IEEE Transactions on Nuclear Science · 1988 · 58 citations

Engineering, Computer Engineering, Electrical Engineering +17

The relationship of proton and heavy ion upset thresholds

Edward L. Peterson · IEEE Transactions on Nuclear Science · 1992 · 55 citations

Natural Sciences, Nuclear Engineering, Physics +12