R. Koga

Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures

Steven C. Moss, S. D. LaLumondiere, J. Scarpulla et al. · IEEE Transactions on Nuclear Science · 1995 · 106 citations

Engineering, Vlsi Design, Laser-plasma Interaction +16

Error Analysis and Prevention of Cosmic Ion-Induced Soft Errors in Static CMOS RAMs

S. E. Diehl, A. Ochoa, P. V. Dressendorfer et al. · IEEE Transactions on Nuclear Science · 1982 · 83 citations

Static Rams Immune, Non-volatile Memory, Engineering +16

Two CMOS memory cells suitable for the design of SEU-tolerant VLSI circuits

Raoul Velazco, D. Bessot, S. Duzellier et al. · IEEE Transactions on Nuclear Science · 1994 · 80 citations

Electrical Engineering, Engineering, Vlsi Design +15

Techniques of Microprocessor Testing and SEU-Rate Prediction

R. Koga, W. A. Kolasinski, Michael T. Marra et al. · IEEE Transactions on Nuclear Science · 1985 · 75 citations

Engineering, Upset Rate, Mem Testing +18

On the suitability of non-hardened high density SRAMs for space applications

R. Koga, William R. Crain, K.B. Crawford et al. · IEEE Transactions on Nuclear Science · 1991 · 73 citations

Device Types, Electrical Engineering, Single Event Upset +15