J. Scarpulla

Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures

Steven C. Moss, S. D. LaLumondiere, J. Scarpulla et al. · IEEE Transactions on Nuclear Science · 1995 · 107 citations

Engineering, Electrical Engineering, Physics +13

A TDDB model of Si/sub 3/N/sub 4/-based capacitors in GaAs MMICs

J. Scarpulla, D. Eng, Stephen Olson et al. · 2003 · 27 citations

Engineering, Electrical Engineering, Materials Science +17

High reliability non-hermetic 0.15 μm GaAs pseudomorphic HEMT MMIC amplifiers

D. Leung, Y.C. Chou, C.S. Wu et al. · 2003 · 24 citations

Engineering, Electrical Engineering, Microelectronics +16

Dielectric breakdown, defects and reliability in SiN MIMCAPs

J. Scarpulla, E. Ahlers, D. Eng et al. · 2002 · 21 citations

Engineering, Electrical Engineering, Materials Science +17

Gate size dependence of the radiation-produced changes in threshold voltage, mobility, and interface state density in bulk CMOS

J. Scarpulla, A. Amram, V.W. Gin et al. · IEEE Transactions on Nuclear Science · 1992 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +17