S. D. LaLumondiere

Observation of single event upsets in analog microcircuits

R. Koga, S.D. Pinkerton, Steven C. Moss et al. · IEEE Transactions on Nuclear Science · 1993 · 128 citations

Engineering, Space Environment, Analog Design +16

Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures

Steven C. Moss, S. D. LaLumondiere, J. Scarpulla et al. · IEEE Transactions on Nuclear Science · 1995 · 106 citations

Engineering, Vlsi Design, Laser-plasma Interaction +16

Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

R.L. Pease, Andrew L. Sternberg, Y. Boulghassoul et al. · IEEE Transactions on Nuclear Science · 2002 · 82 citations

Engineering, Ion Microbeam, Laser-plasma Interaction +16

Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

R. Koga, S.H. Penzin, K.B. Crawford et al. · IEEE Transactions on Nuclear Science · 1997 · 74 citations

Bias Conditions, Electrical Engineering, Single Event Upset +15

Optical communications downlink from a 1.5U Cubesat: OCSD program

Todd S. Rose, Darren Rowen, S. D. LaLumondiere et al. · International Conference on Space Optics — ICSO 2018 · 2019 · 53 citations · Full text