Application of hardness-by-design methodology to radiation-tolerant ASIC technologies

R.C. Lacoe, J.V. Osborn, R. Koga, +2

IEEE Transactions on Nuclear Science

EngineeringCommercial FoundryElectromagnetic CompatibilityRadiation ProtectionPhysical Design (Electronics) +14

Observation of single event upsets in analog microcircuits

R. Koga, S.D. Pinkerton, Steven C. Moss, +5

IEEE Transactions on Nuclear Science

EngineeringSpace EnvironmentAnalog DesignIon Beam InstrumentationExplosions +14

Radiation effects on current field programmable technologies

R. Katz, Kenneth A. LaBel, Jincheng Wang, +4

IEEE Transactions on Nuclear Science

EngineeringVlsi DesignComputer ArchitectureIntegrated CircuitsMulti-channel Memory Architecture +17

Single event functional interrupt (SEFI) sensitivity in microcircuits

R. Koga, S.H. Penzin, K.B. Crawford, +1

Conventional InstrumentationEngineeringMeasurementTiming AnalysisBioelectronics +13

Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

R. Koga, S.H. Penzin, K.B. Crawford, +5

IEEE Transactions on Nuclear Science

Bias ConditionsElectrical EngineeringSingle Event UpsetEngineeringSensitivity Dependence +13

A large double scatter telescope for gamma rays and neutrons

D. Herzo, R. Koga, W. A. Millard, +5

Nuclear Instruments and Methods

Terrestrial Gamma-ray FlashesEngineeringRadiation DetectionPhysicsNuclear Physics +5

Single Event Upsets in Xilinx Virtex-4 FPGA Devices

J. George, R. Koga, G.M. Swift, +3

Hardware SecuritySingle Event UpsetsElectrical EngineeringFunctional BlockEngineering +8

Electron and Proton wide-Angle Spectrometer (EPAS) on the CRRES spacecraft

A. Korth, G. Kremser, B. Wilken, +3

Journal of Spacecraft and Rockets

MissileSpace VehicleEngineeringMissile DefenseHigh-maneuverability Systems +22

Single event upset in irradiated 16 K CMOS SRAMs

Carl L. Axness, J.R. Schwank, P.S. Winokur, +3

IEEE Transactions on Nuclear Science

Single Event UpsetEngineeringRadiation EffectRadiation ExposureRadiation Testing +15

Experimental and analytical investigation of single event, multiple bit upsets in poly-silicon load, 64 K*1 NMOS SRAMs

Yu Song, K. N. Vu, J.S. Cable, +7

IEEE Transactions on Nuclear Science

EngineeringVlsi DesignNuclear PhysicsComputer ArchitectureHardware Security +18